Publications

1221 - 1226 of 1226 publications
CSV

TEM analysis of Gd5(SixGel−x)4, where x=1/2

Acta Materialia
2003

Meyers, J. S.; Chumbley, S.; Laabs, F.; Pecharsky, A. O.

Nanoscale EELS analysis of dielectric function and bandgap properties in GaN and related materials

Micron
2000

Borckt, G.; Lakner, H.

Measuring the thickness of aluminium alloy thin foils using electron energy loss spectroscopy

Materials Characterization
2000

Bardal, A.; Lie, K.

Development of a focused ion beam (FIB) technique to minimize X-ray fluorescence during energy dispersive X-ray spectroscopy (EDS) of FIB specimens in the transmission electron microscope (TEM)

Ultramicroscopy
1999

Longo, D. M.; Howe, J. M.; Johnson, W. C.

Experimental method for determining Cliff–Lorimer factors in transmission electron microscopy (TEM) utilizing stepped wedge-shaped specimens prepared by focused ion beam (FIB) thinning

Ultramicroscopy
1999

Longo, D. M.; Howe, J. M.; Johnson, W. C.

Lead asparate, an en bloc contrast stain particularly useful for ultrastructural enzymology

Journal of Histochemistry and Cytochemistry
1979

Walton, J.

Pages