Advantages:
Transmission electron microscope (TEM) multiple specimen holders provide increased productivity for applications that require comparable screening of multiple specimens.
- Operates at ambient temperature or cryo-temperature, depending on holder model
- Interchangeable cartridge design facilitates handling and storage of fragile specimens
- Opening on one side of FIBBEM™ cartridges allows access of the ion beam and reactive gasses to interact with the samples; cartridge can then be attached to the holder for viewing in the TEM
| Model number | Specimen positioning |
Specimen securing |
Interchangeable cartridge | Operating temperature |
|---|---|---|---|---|
| 677 | α Tilt | Hexring® mechanism |
Yes1,2 | Ambient |
| 677.FIB | α Tilt | FIBBEM cartridge | Yes1 | Ambient |
| 910 | α Tilt | Splitring® mechanism | Yes3 | Less than -170 °C |
2 Small pole piece gap configuration does not have a removable cartridge.
3 Two specimen positions are available in holders for the Hitachi and Zeiss TEMs. Three specimen positions are available in holders for FEI, JEOL and Topcon TEMs.
Models 677, 677FIB, 910
Datasheets
Single Tilt Multiple Specimen Holder, model 677
Single Tilt Multiple Specimen Holder for FIB, model 677FIB
Multi-Specimen Single Tilt Cryo-Transfer Holder, model 910
Related products
Solarus® II System
Turbo Pumping Station
OneView® Camera
Gatan Microscopy Suite® Software