出版物

1151 - 1160 of 1218 publications
CSV

D-STEM: A parallel electron diffraction technique applied to nanomaterials

Microscopy and Microanalysis
2010

Ganesh, K. J.; Kawasaki, M.; Zhou, J. P.; Ferreira, P. J.

Environmental scanning electron microscopy (ESEM)--a versatile tool in studying plants.

Protoplasma
2010

Stabentheiner, E.; Zankel A.; Pölt P.

Detection of neuron membranes in electron microscopy images using a serial neural network architecture

Medical Image Analysis
2010

Jurrus, E.; Paiva, A. R.; Watanabe, S.; Anderson, J. R.; Jones, B. W.; Whitaker, R. T.; Jorgensen, E. M.; Marc, R. E.; Tasdizen, T.

Reconstruction of a neuron from SBFSEM: tools, reliability, accuracy and efficiency

Frontiers in Computational Neuroscience
2010

Drouvelis, P.; Kurz, T.; Bastian, P.; Sakmann, B.; Lang, S.

Dislocation-filtering AlInSb buffer layers for InSb quantum wells—Analysis by high-tilt bright-field and dark-field TEM

Physica E: Low-dimensional Systems and Nanostructures
2010

Mishima, T. D.; Edirisooriya, M.; Santos, M. B.

Enhancing serial block-face scanning electron microscopy to enable high resolution 3-D nanohistology of cells and tissues

Microscopy and Microanalysis
2010

Deerinck, T. J.; Bushong, E. A.; Lev-Ram, V.; Shu, X.; Tsien, R. Y.; Ellisman, M. H.

Gentle STEM: ADF imaging and EELS at low primary energies

Ultramicroscopy
2010

Krivanek, O. L.; Dellby, N.; Murfitt, M. F.; Chisholm, M. F.; Pennycook, T. J.; Suenaga, K.; Nicolosi, V.

High-throughput 3D visualization of large volumes at high resolution by 3View

Microscopy and Microanalysis
2010

Dohnalkova, A.; Kennedy, D.; Mancuso, J.; Marshall, M.; Mainwaring, P.; Fredrickson, J.

Low-temperature transmission electron microscopy study of superconducting Nb3Sn

Physica Status Solidi
2010

Schierning, G.; Theissmann, R.; Acet, M.; Hoelzel, M.; Gruendmayer, J.; Zweck, J.

Imaging and quantifying the morphology of an organic–inorganic nanoparticle at the sub-nanometre level

Nature Nanotechnology
2010

van Schooneveld, M. M.; Gloter, A.; Stephan, O.; Zagonel, L. F.; Koole, R.; Meijerink, A.; Mulder W. J. M.; de Groot, F. M. F.

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