半導体デバイス上の炭化水素堆積物の除去

Solarus IIシステムによるクリーニング後、非晶質化による表面のダメージ層や架橋による変化が除去されている。クリーニングプロトコル:水素+酸素;処理時間:5分;試料:半導体デバイス;SEM像

試料表面のダメージを最小化しシリコンの試料状態を維持

Solarus IIによるプラズマクリーニング後においても、試料表面への非晶質化ダメージを最小化し試料の正しい状態を維持。クリーニングプロトコル:水素+酸素;処理時間:5分;試料:Si<110>;使用装置:TF20

In-situ Diffraction studies with the Rio 16

Study crystalline changes when you combine the diffraction, in-situ, and stage tilt capabilities. No artifacts in the individual images & no beam stop required. Record video at up to 160 fps (Rio 16).

Live, full FOV Au sintering

Full resolution, 4k x 4k, large FOV displayed at 20 fps with the Rio 16 camera.

Easily manage a large list of tasks

When single-particle screening with Latitude S, only schedule a few tasks to get feedback quickly or schedule the microscope to image every marked area.

Simplify repetitive single-particle screening tasks

Utilize the Latitude S grid-based tool to mark hundreds of contiguous or separate regions for investigation. Then apply templates to rapidly define acquisition patterns for each region and magnification you want to attain during your cryo-EM screen.

Use templates to mark many good areas

Latitude S templates let you select one or more areas to minimize repetitive activities while setting up your single-particle screen.

Quickly preview different sample areas

Use Latitude S to pick areas of different thickness or intensity to identify the part of the grid with the best looking samples.

Single-particle screening made simple

Latitude S allows you to just mark regions of the sample you want to screen for cryo-EM and takes away the hassle of setting up complex scripts.

4D STEM experiments enabled by high-speed direct electron detectors

In this webinar, we describe the challenges and opportunities created by 4D STEM.

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