Application Note
Measuring cathodoluminescence at deep ultraviolet wavelengths
March 1, 2025
Light Emitting Materials and Devices
Reveal the interplay between microstructure, defects, and optical properties in light emitting materials to help achieve superior brightness, color accuracy, and device reliability.
Driving innovation in optoelectronics
Light-emitting materials and devices are at the core of technologies such as LEDs, OLEDs, and advanced display systems. Understanding their composition, interfaces, and degradation mechanisms at the nanoscale is critical for improving efficiency, color quality, and lifespan. Gatan provides cutting-edge electron microscopy solutions that reveal these details with unmatched precision.
Why electron microscopy matters for light-emitting materials
Device performance depends on complex interactions among semiconductor layers, dopant distribution, and interfacial structures. Our solutions help you:
- Visualize microstructure and phase distribution in semiconductor layers.
- Analyze elemental composition and dopant distribution for optimized performance.
- Detect defects and degradation mechanisms that impact efficiency and reliability.
- Correlate optical properties with nanoscale morphology for predictive design.
Technologies to accelerate your research
Advanced microscopy and analytical techniques enable precise characterization of light-emitting materials and device architectures, uncovering critical structure–property relationships that enhance efficiency, color quality, and long-term reliability.
Cathodoluminescence (CL)
Provides unique nanoscale optical insights into materials by revealing crystal defects, electronic structure, and trace-element chemistry
Electron backscatter diffraction (EBSD)
Allows detailed microstructural analysis by mapping crystal orientations, phases, and grain boundaries
Electron energy loss spectroscopy (EELS)
Delivers atomic-scale insights into elemental composition and chemical bonding—enabling a deeper understanding of material properties
Energy dispersive x-ray spectroscopy (EDS/EDX)
Facilitates rapid, reliable elemental analysis by detecting characteristic x-rays emitted from a sample, allowing researchers to identify and quantify elements
eaSI Spectrum Imaging
Integrates EELS, EDS, 4D STEM, and more to deliver rich, correlated insights—advancing the understanding of complex, dynamic nanoscale phenomena
Imaging
Delivers high-resolution visualization of biological and inorganic specimens, enabling the study of ultrastructure, material growth, and failure mechanisms
In-situ
Captures real-time nanoscale dynamics under controlled stimuli to uncover fundamental mechanisms and accelerate scientific discovery
Integrated SEM
Combines EDS, EBSD, CL, BSE, and WDS into unified platforms—delivering comprehensive, high-resolution insights into complex materials
Wavelength dispersive x-ray spectroscopy (WDS)
Offers high spectral resolution and sensitivity, enabling precise identification and quantification of trace and light elements in complex samples
Enabling results that drive innovation
Unlock the power of electron microscopy with Gatan—explore cutting-edge applications and discover insights through detailed application notes that fuel scientific breakthroughs.
Application Note
Extending cathodoluminescence detection to infrared wavelengths
October 1, 2024
Application Note
Determining photonic band structure by energy-momentum spectroscopy in an electron microscope
August 1, 2024
Application Note
Electric field-induced structural dynamics in MoS2 observed using in-situ transmission electron microscopy
August 1, 2024
Application Note
Investigating the optical properties of nanophotonic materials far below the diffraction limit
July 1, 2024
Media Gallery
Immerse yourself in the world of scientific discovery—explore striking microscopy images that reveal the unseen, alongside webinars and tutorials showcasing Gatan technologies in action.