What’s New in DigitalMicrograph Software
Explore powerful new tools in DigitalMicrograph 3.62 for 4D STEM, EELS, and spectrum imaging.
STEMx OIM
Calculate orientation and phase maps from 4D STEM data directly in DigitalMicrograph with a user-friendly workflow – No scripting required.
Custom Scanning
- Unlock multiple new scan patterns for use in EELS, 4D STEM, or any other spectrum imaging experiment, and even make your own custom scan pattern via scripting.
- Help decrease sample damage during acquisition of dose fractionated data or in-situ spectrum imaging experiments with new sparse acquisition controls in addition to non-raster scan patterns.
Survey Mapping
- Get real time results with live EELS thickness mapping, live virtual aperture imaging, live differential phase contrast imaging, or customized image processing via scripting.
- Conduct in-situ experiments with real-time EELS and 4D STEM analysis yielding smaller data volumes than full spectrum imaging.
Resources
Downloads
Access the latest versions of application software, firmware, and license tools
Computer Recommendations
View system requirements and hardware guidelines for optimal software performance
EELS.info
Discover the EELS technique family—from step-by-step experiment guides to an interactive Atlas with downloadable spectra
EM Academy
Gain real-world experience through self-paced courses to elevate your electron microscopy research
Issue and Bug Reporting
Submit software issues or bugs directly to the development team for review
Scripts
Download automation and analysis scripts to streamline your workflows
Software Development Kits
Access SDKs for integrating and extending software functionality
What is CL?
Enhance your cathodoluminescence journey—from experiment guides to deeper application insights
STEMx image acknowledgment: Ni nanoplatelet sample fabricated by Felipe Quiroga-Suavita (LPCNO - INSA Toulouse and SMS - UNSW Sydney, EU MSCA-AUFRANDE).