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 Technologies

 4D STEM analysis and mapping capability

4D STEM

4D STEM is the capture of a full 2D diffraction pattern at each pixel position in a STEM map

Cathodoluminescence (CL)

Cathodoluminescence

Unique insight into the chemical and electronic properties of materials at the microscopic level

EELS.info

Cryo-EM

Observe biological specimens in their native environment at cryo-temperatures

Electron backscatter diffraction (EBSD)

EBSD

Provides crystallographic orientation and phase information necessary to understand materials' microstructure-property relationships

Energy dispersive x-ray spectroscopy (EDS/EDX)

EDS/EDX

Energy dispersive x-ray spectroscopy (EDS/EDX) for elemental and compositional analysis

Electron energy loss spectroscopy (EELS)

 EELS and EFTEM

Electron energy loss spectroscopy (EELS) and energy-filtered transmission electron microscopy (EFTEM) for materials analysis

eaSI Spectrum Imaging

eaSI Spectrum Imaging

STEM experiments combined, synced, and linked

Imaging

Imaging

Award winning, high resolution imaging tools help you to understand ultrastructure of biological and inorganic specimens

In-situ

In-situ

Real-time observation of growth processes, chemical reactions and oxidation, irradiation effects, mechanical, magnetic, and ferroelectric properties

Integrated SEM

Integrated SEM

Integrated technologies combine multiple analytical techniques into unified systems that deliver comprehensive materials characterization

MicroED/3DED

MicroED/3DED

Capturing electron diffraction patterns from small crystals while the specimen is continuously rotated in the TEM

Micro x-ray fluorescence (micro-XRF)

Micro-XRF

Delivers high-resolution, non-destructive elemental analysis for diverse materials—ideal for layered, sensitive, or irregular samples

Wavelength dispersive x-ray spectroscopy (WDS)

WDS

Wavelength dispersive x-ray spectroscopy (WDS) for precise elemental identification and quantification

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