Looking for EDAX? You’re in the right place—welcome to Gatan.com

EDAX’s industry-leading solutions for elemental analysis are now part of the Gatan experience—bringing together advanced tools for electron microscopy, spectroscopy, and sample preparation under one roof.

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Automated statistical analysis of the emission properties of microLEDs within an array

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Learn how to unlock deeper insights into microLED performance with automated statistical analysis.

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Don't miss our October and November webinars

Expand your microscopy knowledge this October and November. Join our upcoming webinars for expert insights, practical techniques, and the latest advances in microscopy and microanalysis.

Improved 4D STEM strain mapping of Ge/SiGe heterostructure defects via energy-filtered, precession-assisted 4D STEM

New 4D STEM experiment brief!

This experiment brief demonstrates how STEMx^® Precession enables high-resolution characterization of semiconductor heterostructures, revealing nanoscale structural variations and strain with precision.

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Automated in-situ spectrum imaging with synchronized stimulus control

There is always more to see

That’s why at Gatan we have spent the last 60 years working with our customers to push the boundaries of what can be done with electron microscopy. Together, we have invented new approaches to problems that deliver fresh understanding.

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See the latest applications

Unlock the power of electron microscopy—explore cutting-edge applications, dive into expert-led webinars, and discover insights through detailed application notes that fuel scientific breakthroughs.

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