Gatan | AMETEKSkip to Main Content
No options found
What's New in OIM Analysis

What's New in OIM Analysis 

Explore the latest version 9.1 release that introduces significant enhancements designed to streamline workflows, improve data integrity, and accelerate discovery.

Modern user experience

Modernized user experience

  • Intuitive ribbon-based interface for streamlined navigation.
  • Enhanced zoom controls and menu organization.
  • Direct access to helpful resources from the system information dialog. 
Powerful analysis and visualization

Powerful analysis and visualization

  • Redesigned reindexing workflow and advanced image processing tools, including pattern distortion correction and intensity inversion.
  • Expanded visualization options: Region highlighting, improved color gradients, mixed pole figures, and faster texture calculations.
  • Flexible charting and export features for efficient data handling.
Integrated performance and scientific innovation

Integrated performance and scientific innovation

  • Overhauled import and export workflows, including improved CMV integration and grain data formatting.
  • Robust stitching algorithm and new command line options for batch processing.
  • Advanced capabilities: interphase misorientation handling, kernel average scalar maps, and support for experimental master patterns.
Software, Firmware and License Downloads

Downloads 

Access the latest versions of application software, firmware, and license tools

EM Academy

EM Academy

Gain real-world experience through self-paced courses to elevate your electron microscopy research

Issue and Bug Reporting

Issue and Bug Reporting

Submit software issues or bugs directly to the development team for review

What's new in software - Discover recent updates and new features for current software versions

What's New in Software

Discover recent updates and new features for current software versions