Application Note
Electron ptychography for atomic-scale defect analysis in two-dimensional materials
April 1, 2026
DigitalMicrograph Software
DigitalMicrograph, also known as Gatan Microscopy Suite, drives your digital cameras and surrounding components to support key applications including tomography, in-situ, spectrum and diffraction imaging, plus more.
Advantages
DigitalMicrograph® is the industry standard software for (scanning) transmission electron microscope ((S)TEM) experimental control and analysis, which people also known as Gatan Microscopy Suite®. DigitalMicrograph 3 is completely revamped and uses a new, much-simplified user interface. DigitalMicrograph 3 enables novice users to easily perform basic research applications, while it continues to provide the deep access and control highly experienced microscopists are used to and demand.
Recent highlights:
- Electron energy-loss spectroscopy (EELS)
- CountedEELS acquisition across all voltages with GIF Continuum® system
- Diffraction imaging
- Expands 4D STEM data analysis to include differential phase contrast (DPC)
- Simplifies micro-electron diffraction (MicroED) acquisition with Latitude® D software
- In-situ imaging
- Enables new in-situ data types, including EELS and STEM
- Automates the synchronization of multiple data sets, holders, and processing data
- Cathodoluminescence
- Adds wavelength- and angle-resolved cathodoluminescence for energy-momentum spectroscopy
Technique-centric workflow
Guides you through experimental setup, execution, and analysis
Tabbed workspaces and data layout manager
Provides a user-friendly way to organize and manage data
Dedicated view for live data
Clearly separates newly acquired data from prior experiments
DigitalMicrograph and Python scripting
Uncompromised full control for expert users
Datasheet
Applications
Unlock the power of electron microscopy with Gatan—explore cutting-edge applications, dive into expert-led webinars, and discover insights through detailed application notes that fuel scientific breakthroughs
Application Note
EELS elemental mapping of cryogenically frozen mitochondria in human retinal ganglion cells
August 1, 2025
Application Note
Instant elemental and valence mapping with GIF Continuum using internal standards
August 1, 2024
Application Note
Using EELS to reveal ferric iron content from a Chang’e-5 lunar surface sample
July 1, 2024
Application Note
Live EDS mapping in DigitalMicrograph with EDAX Elite T Super
July 1, 2023
Media Gallery
Immerse yourself in the world of scientific discovery—explore striking microscopy images that reveal the unseen, alongside videos and tutorials showcasing Gatan technology in action.
Resources
Software
Downloads, updates, and application-specific resources
Blog
Discover cutting-edge insights, expert perspectives, and practical applications in electron microscopy
Computer Recommendations
View system requirements and hardware guidelines for optimal software performance
EELS.info
Discover the EELS technique family—from step-by-step experiment guides to an interactive Atlas with downloadable spectra
EM Academy
Gain real-world experience through self-paced courses to elevate your electron microscopy research
FAQs
Find quick answers to common electron microscopy questions with our comprehensive FAQs
Training
Explore in-person and online electron microscopy courses designed to deepen your expertise through hands-on training and flexible, interactive learning
What is CL?
Enhance your cathodoluminescence journey—from experiment guides to deeper application insights
Log4j and Log4Shell Vulnerability
Gatan’s DigitalMicrograph application and Gatan Microscopy Suite (GMS) software suite, including all the plug-ins and modules developed by Gatan, do not use the Log4j framework and is therefore not exposed to the Log4Shell vulnerability.
DigitalMicrograph makes only very limited use of third-party software modules and only uses one that actually installs a Java Virtual Machine, which is necessary to run Log4j. This 3rd party module is developed by National Instruments. Gatan uses a National Instruments card to integrate the JEOL EDS detector, and NI’s statement is available here. National Instruments has indicated that the product we use is not affected.
