Forensics
Reveal trace evidence, material composition, and microstructural details to support forensic investigations with scientific rigor and reliability.
Advancing forensic science with deeper insights
Maintaining the integrity of forensic evidence is essential for criminal investigations and judicial processes. Analytical techniques must deliver precise, reliable results while ensuring delicate samples—such as fibers, residues, and microscopic particulates—remain undisturbed. These materials often exhibit complex, heterogeneous compositions that demand advanced, evidence-based methods for accurate identification and comparison.
Why electron microscopy matters for forensic investigations
Forensic accuracy depends on complex interactions among trace evidence, material composition, and microstructural features. Our solutions help you:
- Visualize microstructure and elemental composition of trace evidence.
- Detect contaminants, residues, and particulates with nanometer-scale precision.
- Identify material origins and compare samples for evidentiary consistency.
- Correlate morphological and chemical data to strengthen forensic conclusions.
Technologies to accelerate your research
Advanced microscopy and analytical techniques enable precise characterization of forensic evidence, uncovering critical structural and compositional details that strengthen investigations and ensure scientific reliability.
Cathodoluminescence (CL)
Provides unique nanoscale optical insights into materials by revealing crystal defects, electronic structure, and trace-element chemistry
Electron backscatter diffraction (EBSD)
Allows detailed microstructural analysis by mapping crystal orientations, phases, and grain boundaries
Energy dispersive x-ray spectroscopy (EDS/EDX)
Facilitates rapid, reliable elemental analysis by detecting characteristic x-rays emitted from a sample, allowing researchers to identify and quantify elements
Integrated SEM
Combines EDS, EBSD, CL, BSE, and WDS into unified platforms—delivering comprehensive, high-resolution insights into complex materials
Micro x-ray fluorescence (micro-XRF)
Delivers high-resolution, non-destructive elemental analysis—ideal for layered, sensitive, or irregular samples
Wavelength dispersive x-ray spectroscopy (WDS)
Offers high spectral resolution and sensitivity, enabling precise identification and quantification of trace and light elements in complex samples
Enabling results that drive innovation
Unlock the power of electron microscopy with Gatan—explore cutting-edge applications and discover insights through detailed application notes that fuel scientific breakthroughs.
Media Gallery
Immerse yourself in the world of scientific discovery—explore striking microscopy images that reveal the unseen, alongside webinars and tutorials showcasing Gatan technologies in action.