Application Note
Combining NPAR with spherical indexing – A unique method to solve the most challenging EBSD indexing problems
May 8, 2024
EDAX Clarity EBSD Detector Series
The world’s first commercial direct detection system designed specifically for EBSD with high-sensitivity and high-fidelity for unparalleled performance.
Advantages
The world’s first commercially available electron backscatter diffraction (EBSD) detector with unparalleled performance as low as 3 kV. This direct detection system is ideal for beam-sensitive perovskite, ceramic, or semiconductor materials that are difficult to analyze using conventional EBSD systems.
Enables the analysis of beam-sensitive samples, preventing damage at low doses, revealing never-before-seen structures
Provides up to 7x improvement in spatial resolution and ensures superior results at low kV
Reveals previously unattainable diffraction bands beyond the detection limit for phosphor-based detectors
Datasheet
Applications
Unlock the power of electron microscopy with Gatan—explore cutting-edge applications, dive into expert-led webinars, and discover insights through detailed application notes that fuel scientific breakthroughs.
Application Note
Characterizing composition and crystallography of a mixed halide perovskite in the SEM
May 8, 2024
Application Note
Analyzing a shot-peened titanium alloy with spherical indexing
April 11, 2024
Application Note
Characterizing directionally solidified Al-Cu-Mg eutectic alloys with combined EDS-EBSD
September 29, 2023
Application Note
EBSD sample preparation on Al/Mg bulk material using the Ilion II system
May 1, 2023
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