Application Note
Analyzing a shot-peened titanium alloy with spherical indexing
April 11, 2024
EDAX OIM Analysis Software
The only fully integrated EBSD software that provides microstructure visualization and analysis for interrogating and understanding your data.
Advantages
EDAX® OIM Analysis™ – The premier microstructural visualization and analysis tool for interrogating and understanding electron backscatter diffraction (EBSD) mapping data. With as little as one click, see how this powerful tool can map large, multidimensional data sets or draw from the most comprehensive analysis portfolio to characterize challenging materials. OIM Analysis not only delivers unprecedented insight into material properties but makes EBSD analysis accessible to novice and expert users alike.
Produces answers to the most common questions with one click using the Quick-Gen predefined analysis tools and templates
Allows you to clearly visualize deformed microstructures and accurately analyze complex materials
Finds key contributors or outliers in your microstructure with its interactive analysis interface
Measures difficult or previously unusable samples using the biggest analysis toolbox available
Datasheet
Applications
Unlock the power of electron microscopy with Gatan—explore cutting-edge applications, dive into expert-led webinars, and discover insights through detailed application notes that fuel scientific breakthroughs.
Application Note
Phase and subgrain mapping in a nanoscale NiAl–(Cr,Mo) eutectic composite
August 29, 2023
Application Note
Interphase analysis in multiphase CoRe alloy
May 1, 2023
Application Note
Optimizing the surface of multiphase Al alloys for successful EBSD analysis
May 1, 2023
Application Note
Damage-free preparation of a porous Zn alloy with a Cu coating
May 1, 2023
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