
Analyzing a shot-peened titanium alloy with spherical indexing
April 11, 2024
Delivers new insights into your material’s microstructure without the need for additional hardware.

The EDAX® Pattern Region of Interest Analysis System (PRIAS) is a synergistic approach for imaging and visualizing a material’s microstructural features. This unique system uses electron backscatter diffraction (EBSD) detectors to capture and index EBSD patterns and as an array of positional electron detectors for sample imaging. By synchronously imaging from up to 25 detector regions of interest (ROIs), multiple images can be generated and displayed simultaneously, showing orientation, atomic number, and topographic contrasts. Further arithmetic processing of this array of images allows unprecedented analysis and visualization of material microstructure and the isolation, enhancement, or suppression of specific contrast mechanisms of interest.
Synchronizes image collection from all ROI detectors to quickly and easily give you the optimum images for visualization
Automates fast PRIAS Live imaging, saving time without the need to manually adjust contrast and brightness for each image
Ensures fast and accurate data collection and analysis with three modes: PRIAS Live, PRIAS Collection, and PRIAS Analysis
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