Application Note
Real-space mapping of deuterated polymers using dark-field EELS
March 1, 2026
STEMPack Spectrum Imaging
Models 877, 878
A powerful method of obtaining detailed analytic data from a sample on an electron microscope equipped with scanning mode.
Advantages
The STEMPack™ 3 system utilizes the next-generation digital image acquisition performance of the DigiScan™ 3 for advanced spectrum imaging (SI) applications. Using the high-performance and flexible scanning of the DigiScan 3, STEMPack 3 provides the link between electron energy loss spectroscopy (EELS) and probe scanning to allow the collection of spectrum image data sets. The STEMPack 3 system provides the backbone behind all spectrum imaging applications from Gatan, creating a unified user experience for all modalities (e.g., EELS, EDS, diffraction, CL).
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Provides a systematic and unbiased sampling of specimen properties
Maximizes analytical specimen information for a given dose
Detailed EELS data is amenable to advanced chemical mapping techniques based on fine structure analysis
Delivers rich, unbiased data ideally suited to powerful techniques like principal component and multivariate statistical analysis
Enables simultaneous multiple signal acquisition* and unique contrast modes
* May require optional components
For more information pertaining to EELS techniques, step-by-step instructions on analytical experiments, and access to downloadable spectra, please visit EELS.info, an educational site that is dedicated to supporting the EELS community.
Datasheet
Applications
Unlock the power of electron microscopy with Gatan—explore cutting-edge applications, dive into expert-led webinars, and discover insights through detailed application notes that fuel scientific breakthroughs.
Application Note
High speed EELS composition analysis, in DualEELS mode, of metal alloy ohmic contacts for the fabrication of III-V MOSFET devices
February 8, 2016
Application Note
Fast simultaneous acquisition of low- and core-loss regions in the EELS spectrum from catalyst particles containing the heavy metals Au and Pd using the GIF Quantum system
February 5, 2016
Application Note
Atomic level EELS mapping using high energy edges in DualEELS mode
February 5, 2016
Media Gallery
Immerse yourself in the world of scientific discovery—explore striking microscopy images that reveal the unseen, alongside videos and tutorials showcasing Gatan technology in action.
Configurations
STEMPack 3 System, model 877
STEMPack 3 Max System, model 878
DigiScan 3 Input Expansion, model 888.U4
DigiScan 3 Fiber Optic Data Link Expansion, model 888.UFO
STEMx® System Upgrade for STEMPack 3, model 1020.DS3.2
STEMPack High-Speed EDS Acquisition Upgrade, model 777.U3
Resources
Explore tools, data, and insights powering electron microscopy—from applications and periodic table resources to expert blogs and newsletters.
EELS.info
Discover the EELS technique family—from step-by-step experiment guides to an interactive Atlas with downloadable spectra
What is CL?
Enhance your cathodoluminescence journey—from experiment guides to deeper application insights
Blog
Discover cutting-edge insights, expert perspectives, and practical applications in electron microscopy
EM Academy
Gain real-world experience through self-paced courses to elevate your electron microscopy research
FAQs
Find quick answers to common electron microscopy questions with our comprehensive FAQs
Service Plans
Preventive maintenance, upgrades, service adjustments and repairs to assure your Gatan products are operating at peak performance
Software
Downloads, updates, and application-specific resources
Training
Explore in-person and online electron microscopy courses designed to deepen your expertise through hands-on training and flexible, interactive learning
