Analytical Holders

Models 643, 646, 650, 925

Optimized for EDS analysis at ambient temperature.

Advantages

TEM analytical holders are designed for basic imaging and analytical applications, such as electron diffraction and energy dispersive x-ray spectroscopy (EDS) analysis of crystalline TEM specimens.

A beryllium specimen cradle minimizes unwanted x-ray signals

Cut-outs in the specimen tip are matched to the TEM configuration and provide a clear path between the sample and detector to reduce shadowing for EDS analysis.

To facilitate quantitative x-ray analysis, non-rotating holder versions are equipped with a small Faraday cup located near the specimen cradle at the tip of the holder

Electrical connections are available for the non-rotating versions of the holder

Model number	Beryllium cradle	Specimen positioning	Specimen securing	Motorized control	Faraday cup	Max. electrical feed-throughs (optional)
643	Standard	α tilt	Hexring^®		Standard	6
646	Standard	α, β Tilt	Hexring	β Tilt	Standard	4 – 6¹
650	Standard	α Tilt and rotation	Hexring	Rotation	No	0
925	Standard	α, β Tilt and rotation¹	Hexring		No	0