Electron ptychography for atomic-scale defect analysis in two-dimensional materials

Instruments used

Stela^®* hybrid-pixel camera, STEMx^® system, eaSI™ technology, and DigitalMicrograph^® software

Background

Electron ptychography has emerged as a transformative technique for achieving sub-angstrom resolution in electron microscopy. By leveraging coherent electron beams and advanced pixelated detectors, this method enables the reconstruction of phase information from diffraction patterns, providing insight into atomic-scale structures. Such capabilities are particularly critical for studying two-dimensional materials, where single-atom defects can significantly influence electronic, optical, and catalytic properties. The ability to directly visualize these defects supports the development of next-generation semiconductors and quantum devices.

*Utilizes DECTRIS technology