Orientation mapping of nanograined Au films in DigitalMicrograph

Gatan instrument used

The ClearView^® camera enables 4D STEM data acquisition at up to 1,600 frames per second, the fastest speed of any scintillator camera. STEMx^® OIM brings diffraction indexing and orientation mapping capabilities to the 4D STEM data collected with a Gatan camera. eaSI™ technology combines, syncs, and links the orientation mapping data to correlated spectrum imaging datasets.

Background

It is important to understand material grain size, structure, and defect density for their material strength and other properties. Orientation mapping analysis of the grain structure is commonly done in the scanning electron microscope (SEM) using electron backscatter diffraction (EBSD) techniques. However, the higher resolution capabilities of the scanning transmission electron microscope (STEM) have become more useful for analyzing nanograined materials. In this case, 4D STEM analysis and subsequent orientation mapping with STEMx OIM becomes the better approach.