Spectroscopic time-resolved cathodoluminescence using a conventional scanning electron microscope (SEM)

Gatan instrument used

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Background

The temporal evolution of luminescence from semiconductor materials, phosphors, and geological samples can reveal important properties of the luminescence mechanism. The luminescence decay constant, τ, can be measured and, typically, varies as a function of emission wavelength. Determination of τ can reveal recombination dynamics relevant to stress and strain, mobility, and diffusion length. In an electron microscope, investigation of τ is challenging experimentally due to the requirement for a pulsed electron beam with ultra-fast on/off transitions; possible solutions include ultrafast beam blanking and photoemission-induced electron pulses. However, these schemes are suitable for a very limited range of specialized microscopes.