Webinar
Off the grid: Advanced scanning strategies for modern STEM
March 12, 2026
Lead
Element density: 11.34 g/cm3
Electron configuration: [Xe]4f145d106s26p2
Oxidation states: +2,4
X-ray peak intensities
A quick-reference for exploring x-ray peak intensities across element series (K, L, M, N) to support accurate EDS analysis in electron microscopy.
| K-Series | L-Series | M-Series | N-Series | ||||
|---|---|---|---|---|---|---|---|
| Kα | 74.976 | Ll | 9.182 | Mz | 1.839 | N | 0.284 |
| Kβ | 85.051 | Ln | 11.345 | Mα | 2.342 | ||
| Lα1 | 10.548 | Mβ | 2.442 | ||||
| Lβ1 | 12.610 | Mγ | 2.652 | ||||
| Lβ2 | 12.617 | M2N4 | 3.124 | ||||
| Lγ1 | 14.756 | ||||||
| Lγ2 | 15.094 | ||||||
Applications
Unlock the power of electron microscopy with Gatan—explore cutting-edge applications, dive into expert-led webinars, and discover insights through detailed application notes that fuel scientific breakthroughs.
Application Note
Nanobeam strain analysis using STEMx system and your existing Gatan in-situ camera
March 1, 2025
Application Note
Characterizing composition and crystallography of a mixed halide perovskite in the SEM
May 8, 2024
Application Note
Use of a large area windowless EDS detector for quantitative analysis of heavy elements at high accelerating voltages
April 2, 2024
Application Note
High-speed composition and chemical analysis of nanoelectronic materials with GIF Continuum
January 1, 2024
Media Gallery
Immerse yourself in the world of scientific discovery—explore striking microscopy images that reveal the unseen, alongside videos and tutorials showcasing Gatan technology in action.
