Application Note
Enhancements from EDS to WDS
January 24, 2024
Tantalum
Element density: 16.65 g/cm3
Electron configuration: [Xe]4f145d36s2
Oxidation states: +5
X-ray peak intensities
A quick-reference for exploring x-ray peak intensities across element series (K, L, M, N) to support accurate EDS analysis in electron microscopy.
| K-Series | L-Series | M-Series | N-Series | ||||
|---|---|---|---|---|---|---|---|
| Kα | 57.540 | Ll | 7.171 | Mz | 1.331 | N | 0.208 |
| Kβ | 65.348 | Ln | 8.426 | Mα | 1.709 | ||
| Lα1 | 8.143 | Mβ | 1.765 | ||||
| Lβ1 | 9.341 | Mγ | 1.964 | ||||
| Lβ2 | 9.647 | M2N4 | 2.225 | ||||
| Lγ1 | 10.891 | ||||||
| Lγ2 | 11.213 | ||||||
Applications
Unlock the power of electron microscopy with Gatan—explore cutting-edge applications, dive into expert-led webinars, and discover insights through detailed application notes that fuel scientific breakthroughs.
Application Note
High-speed composition and chemical analysis of nanoelectronic materials with GIF Continuum
January 1, 2024
Application Note
Interphase analysis in multiphase CoRe alloy
May 1, 2023
Media Gallery
Immerse yourself in the world of scientific discovery—explore striking microscopy images that reveal the unseen, alongside videos and tutorials showcasing Gatan technology in action.
