Data courtesy of National Center for Electron Microscopy, LBNL, Berkeley, CA, USA and Faculty of Technology & Metallurgy at U. of Belgrade, Serbia.
High resolution observations of interface dynamics using a direct electron detection camera
4/6 Multilayer step—Last 0.05 s
- Step height n/m=4/6 – 4 planes in lower grain meet 6 planes in the upper grain
- Preserved ABAB…stacking sequence over the step interface
- Buried step parallel to the surface forms during step migration (b-d)
- “Shadow” of the step most likely due to remanence at the surface (e)
This work is supported by DOE/BES/MSD under Contract No.DE-AC02—05CH11231.