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1201 - 1210 of 1212 publications
CSV

Nanoimaging and spectroscopic analysis of rubber/ZnO interfaces by energy-tiltering transmission electron microscopy

Langmuir
2006

Horiuchi, S.; Dohi, H.

Local indium segregation and band gap variations in high efficiency green light emitting InGaN/GaN diodes

Solid State Communications
2006

Jinschek, J. R.; Erni, R.; Gardner, N. F.; Kim, A. Y.; Kisielowski, C.

Pr0.5Ca0.5Mn0.97Ga0.03O3, a strongly strained system due to the coexistence of two orbital ordered phases at low temperature

Journal of Solid State Chemistry
2005

Yaicle, C.; Fauth, F.; Martin, C.; Retoux, R.; Jirak, Z.; Hervieu, M.; Raveau, B.; Maignan, A.

Nanoscale analysis of polymer interfaces by energy-filtering transmission electron microscopy

Macromolecular Chemistry and Physics
2005

Horiuchi, S.; Yin, D.; Ougizawa, T.

Serial block-face scanning electron microscopy to reconstruct three-dimensional tissue nanostructure

Public Library of Science
2004

Denk, W.; Horstmann, H.

TEM-EELS study of natural ferrihydrite from geological-biological interactions in hydrothermal systems

Earth and Planetary Science Letters
2004

Gloter, A.; Zbinden, M.; Guyot, F.; Gaill, F.; Colliex, C.

TEM analysis of Gd5(SixGel−x)4, where x=1/2

Acta Materialia
2003

Meyers, J. S.; Chumbley, S.; Laabs, F.; Pecharsky, A. O.

Nanoscale EELS analysis of dielectric function and bandgap properties in GaN and related materials

Micron
2000

Borckt, G.; Lakner, H.

Measuring the thickness of aluminium alloy thin foils using electron energy loss spectroscopy

Materials Characterization
2000

Bardal, A.; Lie, K.

Development of a focused ion beam (FIB) technique to minimize X-ray fluorescence during energy dispersive X-ray spectroscopy (EDS) of FIB specimens in the transmission electron microscope (TEM)

Ultramicroscopy
1999

Longo, D. M.; Howe, J. M.; Johnson, W. C.

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