Multiple Specimen Holders
Accommodate multiple specimens for increased productivity.
Advantages
Transmission electron microscope (TEM) multiple specimen holders provide increased productivity for applications that require comparable screening of multiple specimens.
Operates at ambient temperature or cryo-temperature, depending on holder model
Interchangeable cartridge design facilitates handling and storage of fragile specimens
Opening on one side of FIBBEM™ cartridges allows access of the ion beam and reactive gasses to interact with the samples; cartridge can then be attached to the holder for viewing in the TEM
| Model number | Specimen positioning | Specimen securing | Interchangeable cartridge | Operating temperature |
|---|---|---|---|---|
| 677 | α Tilt | Hexring® mechanism | Yes1,2 | Ambient |
| 677.FIB | α Tilt | FIBBEM cartridge | Yes1 | Ambient |
1 Two specimen positions are available in holders for the Hitachi and Zeiss TEMs. Three specimen positions are available in holders for FEI and Topcon TEMs. Five specimen positions are available in holders for the JEOL TEMs.
2 Small pole piece gap configuration does not have a removable cartridge.
Datasheets
Resources
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Service Plans
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Software
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Store
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