Application Note
Characterizing silicon carbide polymorphs with EBSD using spherical indexing
December 11, 2025
EDAX Velocity EBSD Camera Series
Offers fast EBSD mapping for routine, 3D, and in-situ materials characterization.
Advantages
The EDAX® Velocity™ EBSD camera series offers high-speed electron backscatter diffraction (EBSD) mapping with the best indexing performance on real-world materials. Powered by a CMOS sensor, the Velocity combines fast acquisition with high sensitivity and low noise performance for optimal collection and data quality.
Collects EBSD maps in minutes with indexing speeds up to 6,700 ipps with up to 99% indexing success rates
Produces orientation precision of less that 0.1° for clear characterization of deformed microstructures with standard indexing routines
Shortens your time to results by collecting data up to 18% faster than other phosphor-based EBSD detectors
Datasheet
Applications
Unlock the power of electron microscopy with Gatan—explore cutting-edge applications, dive into expert-led webinars, and discover insights through detailed application notes that fuel scientific breakthroughs.
Application Note
Identifying titanium hydride in a titanium alloy using EBSD and quantitative backscatter imaging
May 1, 2025
Application Note
Resolving bimodal grain distribution in Zr-Al alloy with high efficiency and accuracy
September 1, 2024
Application Note
Determining the microstructure of zinc-lithium alloys for enhanced biomedical devices
May 8, 2024
Application Note
Complete characterization with integrated EDS-EBSD
September 29, 2023
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