Application Note
Breakthroughs in light element detection using a large-area windowless EDS detector
November 24, 2025
EDAX Octane Elite EDS/EDX System
Delivers answers that fast-track your microanalysis with outstanding EDS results for light and heavy elements.
Advantages
The game-changing advancements in the EDAX® Octane Elite energy dispersive x-ray spectroscopy (EDS/EDX) system with Octane Elite silicon drift detectors (SDDs) take EDS analysis to the next level. This system includes detectors with a silicon nitride (Si3N4) window, offering remarkable improvements in low energy sensitivity for light element detection and low kV microanalysis. The Octane Elite detectors also use high-speed x-ray data processing technology within a smaller and fully vacuum-encapsulated detector device.
Reveal elemental or phase distribution up to 10x faster than other detectors
Quantify a sample’s composition in seconds using eZAF-corrected standardless analysis and computed physical background models
Deliver answers to analytical problems up to 5x faster than other systems
10x better resolution stability at 500,000 icps than other systems
Datasheet
Applications
Unlock the power of electron microscopy with Gatan—explore cutting-edge applications, dive into expert-led webinars, and discover insights through detailed application notes that fuel scientific breakthroughs.
Application Note
Revealing the distribution of fluorine in battery cathodes with EDS and WDS mapping
November 1, 2025
Application Note
Streamlined microanalysis in the SEM
November 1, 2025
Application Note
Identifying titanium hydride in a titanium alloy using EBSD and quantitative backscatter imaging
May 1, 2025
Application Note
Breaking through EDS limitations: A study on using WDS for silicon wafer contaminant detection
April 15, 2025
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