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Cipher System (EDS-BSE)

Model 475

The first and only system that quantitatively reveals the distribution of lithium in scanning electron microscopes.

Cipher System (EDS-BSE)
 

Advantages 

Cipher® – The first and only system that quantitatively reveals the distribution of lithium in scanning electron microscopes and dual beam instruments. Using the groundbreaking lithium by composition by difference method (Li-CDM), Cipher determines the lithium content in metallic alloys, compounds, and complex metal oxides down to single-digit weight percentages accelerating the development of renewable energy materials and aerospace alloys.

 

Reveals the previously unobservable distribution of lithium at the microscale in a wide variety of materials

Reveals the previously unobservable distribution of lithium at the microscale in a wide variety of materials

Determines the charge state of oxide particles used as cathodes in lithium-ion batteries, such as lithium nickel manganese cobalt oxide (NMC) and lithium iron phosphate (LFP)

Determines the charge state of oxide particles used as cathodes in lithium-ion batteries, such as lithium NMC and LFP

Delivers quantitative analysis of lithium with a greater than tenfold improvement in the minimum detection limit

Delivers quantitative analysis of lithium with a greater than tenfold improvement in the minimum detection limit

 

Datasheet

Applications

Unlock the power of electron microscopy with Gatan—explore cutting-edge applications, dive into expert-led webinars, and discover insights through detailed application notes that fuel scientific breakthroughs. 

Media Gallery

Immerse yourself in the world of scientific discovery—explore striking microscopy images that reveal the unseen, alongside videos and tutorials showcasing Gatan technology in action. 

Secondary electron image and elemental metal fraction maps (by wt. %) of the same region of the MgLiAl alloy; white pixels are regions excluded from the analysis due to influence of topography (identified by arrows in the secondary electron image) shown here for clarity.
Secondary electron image and elemental metal fraction maps (by wt. %) of the same region of the MgLiAl alloy; white pixels are regions excluded from the analysis due to influence of topography.

Resources 

Explore tools, data, and insights powering electron microscopy—from applications and periodic table resources to expert blogs and newsletters. 

Blog - Discover cutting-edge insights, expert perspectives, and practical applications in electron microscopy.

Blog

Discover cutting-edge insights, expert perspectives, and practical applications in electron microscopy 

EM Academy

EM Academy

Gain real-world experience through self-paced courses to elevate your electron microscopy research 

FAQs 

FAQs

Find quick answers to common electron microscopy questions with our comprehensive FAQs 

Service Plans 

Service Plan

Preventive maintenance, upgrades, service adjustments and repairs to assure your Gatan products are operating at peak performance 

Training

Training

Explore in-person and online electron microscopy courses designed to deepen your expertise through hands-on training and flexible, interactive learning 

Related Products

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