Application Note
Identifying titanium hydride in a titanium alloy using EBSD and quantitative backscatter imaging
May 1, 2025
OnPoint BSE Detector
Models 400, 401
A backscattered electron detector for high speed low kV imaging in the SEM.
Advantages
The OnPoint® detector is the standard for backscattered electron (BSE) detection that delivers unprecedented sensitivity and speed to better understand lightweight metals, polymers, plastics, and biological materials. Using a detector optimized for low kV, this system expands your ability to study low atomic number (Z) elements, uncoated biological samples, and large 3D datasets.
Resolves features distorted by charging or beam damage
Attains images at low kV to reduce charge build-up and to prevent damage to delicate samples
Captures large, 3D datasets quickly
Acquires large field of view images or 3D datasets up to six times faster
Differentiates low-Z elements
Delivers the highest signal-to-noise ratio (SNR) available to help differentiate between elements with a similar atomic number
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Provides highest BSE collection efficiency
Produces higher SNR images because it captures electrons other detectors miss as well as minimizes the noise in the detection system
Achieves most accurate quantification
Forms images with the widest dynamic range enabling the most accurate determination of elemental composition in alloys and compounds
Datasheet
Applications
Unlock the power of electron microscopy with Gatan—explore cutting-edge applications, dive into expert-led webinars, and discover insights through detailed application notes that fuel scientific breakthroughs.
Application Note
Quantified backscattered electron analysis in the SEM
July 1, 2024
Application Note
Revealing the lithium content in aerospace alloys
July 1, 2024
Application Note
Quantitative mapping of lithium in a scanning electron microscope
July 1, 2024
Application Note
Lithium quantification using the composition-by-difference method
July 1, 2024
Media Gallery
Immerse yourself in the world of scientific discovery—explore striking microscopy images that reveal the unseen, alongside videos and tutorials showcasing Gatan technology in action.
Image shows that the OnPoint BSE detector can resolve features at 1.1 kV (right) that were previously distorted (e.g., black spots) by charging or beam damage at 2.2 kV (left). Sample: Mouse cerebellum. Image courtesy of T. Deerinck NCMIR/UCSD.
OnPoint increases 3View imaging speed four-fold
Demonstrates how low kV conditions can preserve and discriminate fine features, such as synaptic vesicles. Sample: 2 kV, 0.2 nm pixels, 24k x 24k image, 1 µs dwell time. Image courtesy of T. Deerinck NCMIR/UCSD.
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Secondary electron image and elemental metal fraction maps (by wt. %) of the same region of the MgLiAl alloy; white pixels are regions excluded from the analysis due to influence of topography.
Resources
Explore tools, data, and insights powering electron microscopy—from applications and periodic table resources to expert blogs and newsletters.
Blog
Discover cutting-edge insights, expert perspectives, and practical applications in electron microscopy
EM Academy
Gain real-world experience through self-paced courses to elevate your electron microscopy research
FAQs
Find quick answers to common electron microscopy questions with our comprehensive FAQs
Service Plan
Preventive maintenance, upgrades, service adjustments and repairs to assure your Gatan products are operating at peak performance
Software
Downloads, updates, and application-specific resources
