
Analyzing a shot-peened titanium alloy with spherical indexing
April 11, 2024
The ideal software package for producing high-quality, accurate, fast crystallographic analysis.

EDAX® APEX™ EBSD enables the characterization of electron backscatter diffraction (EBSD) patterns within a user-friendly software platform. Combining powerful pattern analysis and an intuitive interface allows you to collect and report high-quality data quickly, easily, and reliably. Paired with EDAX hardware, APEX increases user productivity and offers the best solution for microstructural characterization.
Produces high-quality, indexing results, maximizing sensitivity to rogue band detection with the unique three-bands indexing
Ensures accurate results with Confidence Index, a quantitative quality measurement for crystallographic indexing
Transfers results quickly to the EDAX OIM Analysis™ software for all your post-processing needs
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