Application Note
Identifying titanium hydride in a titanium alloy using EBSD and quantitative backscatter imaging
May 1, 2025
PECS III System
Designed to produce consistent, high‑quality surfaces across semiconductors, batteries, and advanced materials using a single, integrated workflow.
Advantages
The PECS™ III is a broad-beam argon ion milling system designed to produce consistent, high‑quality surfaces across semiconductors, batteries, and advanced materials using a single, integrated workflow. It enables reliable surface preparation for complex, multi‑material samples while minimizing operator dependence and preparation-induced artifacts.
Consistent, high quality surfaces
Produces uniform, low damage surfaces suitable for demanding analytical techniques across a wide range of materials.
High throughput for complex materials
Improves milling rates by 4.4x and enables preparation of larger areas for faster, more meaningful results.
Up to 7x wider cross-section capability
Prepares large area cross-sections with ease, supporting semiconductor, battery, and multilayer systems.
Universal, simple preparation across diverse materials
Ensures predictable, repeatable outcomes independent of operator skill, reducing rework and preparation variability.
Streamlined workflow
Delivers results using one preparation workflow, reducing handling steps and improving overall efficiency.
Integrated coating functionality
Deposits consistently thin coatings to protect sample surfaces and enable analysis of delicate and non-conductive materials.
Datasheet
Applications
Unlock the power of electron microscopy with Gatan—explore cutting-edge applications, dive into expert-led webinars, and discover insights through detailed application notes that fuel scientific breakthroughs.
Application Note
Breaking through EDS limitations: A study on using WDS for silicon wafer contaminant detection
April 15, 2025
Application Note
Quantified backscattered electron analysis in the SEM
July 1, 2024
Application Note
Specimen surface and thickness effects on EDS mapping
July 1, 2024
Application Note
Determining the microstructure of zinc-lithium alloys for enhanced biomedical devices
May 8, 2024
Media Gallery
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Resources
Explore tools, data, and insights powering electron microscopy—from applications and periodic table resources to expert blogs and newsletters.
Blog
Discover cutting-edge insights, expert perspectives, and practical applications in electron microscopy
EM Academy
Gain real-world experience through self-paced courses to elevate your electron microscopy research
FAQs
Find quick answers to common electron microscopy questions with our comprehensive FAQs
Firmware
Downloads, updates, and application-specific resources
Service Plans
Preventive maintenance, upgrades, service adjustments and repairs to assure your Gatan products are operating at peak performance
Store
Easily order the spares and consumables you need to keep your studies running
