Fast-track the search for inclusions and trace elements with EDAX APEX software

Instruments used

EDAX^® Octane Elite Super detector and EDAX APEX™ software for EDS

Background

A common goal of microanalysis by energy dispersive x-ray spectroscopy (EDS) is to reveal inclusions within a sample. Often, the composition of an inclusion is not known before analysis and will only form a small fraction of the area analyzed. Consequently, they can be challenging to uncover by conventional EDS mapping even for an experienced microanalyst due to the relatively few x-ray counts produced. During EDS mapping, a cumulative spectrum (summed over all points) is displayed to identify elements present in the sample and display their elemental maps. This is a powerful means of identifying major elements and phases but hides impurities or inclusions that only make up a small contribution to the total signal. However, APEX software for EDS enables users to quickly identify impurities even if they are of unknown constituent elements.