Specimen Preparation

The Ion Mill You Know: Reborn

695 Precision Ion Polishing System II (PIPS™ II)



The Precision Ion Polishing System II (PIPS™II) is a revolutionary enhancement of the PIPS™ Ion Mill System which has defined the standard for TEM sample preparation for 20 years.

The PIPS™II incorporates the patented Whisperlok® with the X,Y positioning stage for precise centering of the milling target. The PIPS™II incorporates a 10 inch touch screen for ease of use and increased control and reproducibility of the milling process.

The Digital Zoom Microscope monitors the polishing process in real time and the color images can be stored in Gatan’s Digital Micrograph® software for review and analysis while the sample is in the TEM.

Application Note: Ready, Set, Go! Ensuring an Identical TEM Specimen Preparation Route Again and Again. NEW



Features and Benefits



Specifications


Specifications are subject to change.

For complete product and ordering information, please click here or contact your local Gatan Sales office.

Top images: Benefits of low voltage operation: ZnO on Sapphire. Images courtesy of P. Vennéguès - CRHEA-CNRS, France.
Bottom images: Correlation of optical images from Gatan Precision Ion Polishing System II (PIPS™II) viewing camera with low and high magnification TEM images. Representative images showing capability, not indicative of ultimate sample quality. Courtesy NCEM, USA.


References