Application Note
Characterizing silicon carbide polymorphs with EBSD using spherical indexing
December 11, 2025
EDAX OIM Matrix Software
EDAX OIM Matrix is an optional software module used to improve EBSD indexing performance and orientation precision.
Advantages
EDAX® OIM Matrix™ software elevates electron backscatter diffraction (EBSD) analysis by allowing users to simulate patterns based on the physics of the dynamical diffraction of electrons. This optional module for EDAX OIM Analysis™ more accurately describes electron interaction behaviors within a sample and produces more realistic pattern simulations than traditional kinematic diffraction-based approaches. These simulated patterns can be more easily and accurately compared with experimentally collected EBSD patterns to improve indexing performance and orientation precision.
Improves indexing performance compared to traditional Hough-based indexing with the proprietary spherical indexing approach
Accelerates reindexing to >10,000 pps
Achieves precision results >0.01° allowing you to clearly see deformed microstructures with orientation refinement
Simulates EBSD pattern details accurately with dynamical diffraction to maximize data collection from difficult samples
Datasheet
Applications
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Application Note
Identifying titanium hydride in a titanium alloy using EBSD and quantitative backscatter imaging
May 1, 2025
Application Note
Resolving bimodal grain distribution in Zr-Al alloy with high efficiency and accuracy
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Application Note
Combining NPAR with spherical indexing – A unique method to solve the most challenging EBSD indexing problems
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Application Note
Analyzing a shot-peened titanium alloy with spherical indexing
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