Extremely dose-efficient EELS spectrum image acquisition with Gatan eaSI technology

In an electron microscope, core-loss inelastic scattering events are relatively rare. However, these inelastic events reveal a wealth of desirable material information, such as the atomic resolution distribution of elements in the material and their bonding and electronic state. In the scanning transmission electron microscope (STEM), electron energy loss spectroscopy (EELS) spectrum imaging (SI) is the method of choice for collecting these events at atomic resolution. Still, this method has traditionally been limited in speed and efficiency by the hardware and acquisition strategies employed.

In this webinar, we demonstrate the capabilities of Gatan’s Stela® hybrid-pixel camera, powered by DECTRIS, and eaSI technology, which together enable STEM-EELS SI data capture at rates of up to 9,000 pixels/s. Data is collected and processed at this rate in real-time to give immediate feedback on an experiment in progress. With live continuous drift correction in Gatan’s DigitalMicrograph® software, delays between frames are eliminated to allow the most efficient use of the near-zero read noise Stela camera. We will present best practice workflows that simultaneously minimize specimen damage and allow atomic resolution STEM-EELS data capture, even when using a conventional, uncorrected microscope.

Presenter: Liam Spillane, Analytical Application Scientist, Gatan


Thursday, March 28, 2024
8:00 am - 9:00 am
United States