Understanding deformation and failure mechanisms via multimodal and multiscale electron microscopy

In this webinar Josh Kacher, from Georgia Tech, discussed the work his group is doing in applying advanced multiscale and multimodal electron-microscopy based characterization techniques to understand mechanical deformation and failure processes. He focused his results on two materials applications: understanding the influence of second phase particles in ductile failure of Al alloys and determining the role of processing conditions in strain localization during cyclic loading of additive manufactured alloys.

In Situ Electron Energy Loss Spectroscopy for Nanoscale Characterization of Materials Webinar

This webinar illustrates the application of core-loss and low-loss EELS for in situ materials characterization. Observations of in situ reductions, vacancy ordering, and gas-solid interactions can all be characterized with in situ STEM EELS. Aloof beam EELS approaches can be useful for probing near surface regions especially for systems susceptible to electron beam damage.

Cathodoluminescence Explained. Episode 1: An Introduction

This webinar serves as an introduction to the CL technique and key application challenges addressed by CL highlighting some of the latest research from the world of nanophotonics, micro-LED device development and microanalysis.  

オンラインセミナー: Monarcシリーズ SEM用新型カソードルミネッセンスシステムのご紹介

「本ウェビナーでは、最新型カソードルミネッセンスシステムであるMonarcによる、測定におけるデータの高速・高品質化の事例と共に、角度分解CL(ARCL)、波長・角度分解CL(WARCL)などの新たな測定手法についてご紹介致します。」

Solarus Ⅱ 新型プラズマクリーナーの紹介

本WebinarではSolarus Ⅱの概要とその特徴についてご紹介いたします。

新型エネルギーフィルタ、Continuumシリーズにより実現した次世代のEELS、EFTEM分析

このWebセミナーでは、Continuumシリーズの新機能と改良点を中心にアプリケーションデータを紹介します。

Chemical and compositional analysis of 3D NAND and FinFET devices

Learn how the complementary nature of electron energy loss spectroscopy (EELS) and energy dispersive spectroscopy (EDS) signals makes it highly desirable to acquire both during transmission electron microscope (TEM) investigations of materials. With ongoing improvements in electron instrumentation and detectors, it is now practical to acquire joint EELS-EDS spectrum image data for materials analysis all the way from large area mapping down to atomic scale analysis.

オンラインセミナー: OneView & Rio

本ウェビナーでは、CMOSカメラとCCDカメラの違い、OneViewカメラとRioカメラの特徴、およびオプションを含めた新機能とその有用性についてご紹介致します。

Imaging Diverse Biological Specimens in a Core Facility

This webinar showcases the Rio camera by presenting data collected from a diverse set of biological specimens in the UC Berkeley Electron Microscope Laboratory.

Webinar: エネルギー損失分光法のデータ取得における直接検出型検出器のアドバンテージ

エネルギー損失分光法の分解能と感度向上における直接検出型検出器の効果について、様々な分析結果と共にご紹介します。

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