The GIF Quantum® K2® system provides fundamental insights into both the compositional and chemical properties of materials by combining high-performance, post-column energy filter/spectrometer with both counting and analog detection technologies. This unique combination delivers unprecedented results to enhance material research, failure analysis, low-dose and cryo-electron microscopy studies. This system operates in two different modalities
- Counting mode: Leverages the counting capabilities of the K2 camera to provide the highest detective quantum efficiency (DQE) available for low-dose imaging, spectroscopy and spectrum imaging applications
- Analog mode: Traditional CCD-based analog detection mode for high-dynamic range imaging and spectroscopy applications
The GIF Quantum IS system takes this technology one step further by enabling sub-millisecond temporal resolution imaging. This unprecedented speed combined with energy filtered imaging creates elucidating contrast modes for in-situ experiments, such as zero-loss filtered, most probable loss, and plasmon shift images.
The GIF Quantum K2 system was developed with the support of Drexel University’s Dynamic Characterization Group lead by Prof. M. Taheri and NSF MRI award # 1429661.
Models 969, 970
Observing the effects of oxygen activity on NCA battery electrodes via in-situ EELS
Atomic level EELS mapping using high energy edges in DualEELS™ mode
High speed EELS composition analysis, in DualEELS mode, of metal alloy ohmic contacts for the fabrication of III-V MOSFET devices
EELS: A tool for investigating biological materials
Fast simultaneous acquisition of low- and core-loss regions in the EELS spectrum from catalyst particles containing the heavy metals Au and Pd using the GIF Quantum® system
Fast STEM spectrum imaging using simultaneous EELS and EDS in Gatan Microscopy Suite® software
Review of recent advances in spectrum imaging and its extension to reciprocal space
The use of MLLS fitting approach to resolve overlapping edges in the EELS spectrum at the atomic level
Fast STEM EELS spectrum imaging analysis of Pd-Au based catalysts
The high efficiency of the latest generation EELS spectrometers allow highly detailed EELS spectra from heavy elements to be acquired in a matter of milliseconds resulting in composition maps with outstanding information content.
A quantitative investigation of biological materials using EELS
EELS has proved to be a valuable tool to obtain compositional information from biological samples. In addition to the composition, EELS also gives insight into the chemistry unveiling the nature of the chemical bonds and different oxidation states.
High-speed composition analysis of high-z metal alloys in DualEELS mode
Demonstrating that high-speed atomic EELS composition maps with high contrast and high signal-to-noise ratio can be acquired routinely from high-energy edges.
Fast atomic level EELS mapping analysis using high-energy edges in DualEELS mode
Demonstrating that atomic EELS mapping using high-energy edges is very effective. The high signal-to-background ratio of high-energy edges leads to simplified data extraction.
Atomic resolved EELS analysis across interfaces in III-V MOSFET high-k dielectric gate stacks
Demonstrating that EELS SI can reveal the elemental distribution at the gate of high-k MOSFET devices at atomic column level.
K3™ Direct Detection Camera
GIF Continuum™ and Continuum S
Advanced AutoFilter® Suite
Advanced STEM Detectors
STEMPack™ with Advanced BF/DF Detector
STEMPack High-Speed Spectrum Imaging Upgrade
STEMPack High-Speed EDS Acquisition Upgrade