Diffraction Workshop hosted by Gatan & AIF

See how high-speed diffraction experiments like 4D STEM are changing the landscape of electron microscopy by introducing new capabilities like differential phase contrast (DPC) imaging, electric field mapping, and much more.

This recording is from a workshop featuring advanced capabilities and techniques in the realm of imaging and diffraction hosted by Gatan and the Analytical Instrumentation Facility (AIF) at NC State University.