Paolo Longo, Ph.D., Gatan, Inc.
Microscope and sample courtesy of Dr. Maria Varela at Oak Ridge National Lab, Oak Ridge, TN
EELS analysis of metal segregation across grain boundary in Yttria-stabilized Zirconia (YSZ) – investigating oxygen vacancies
EELS data were acquired using a probe-corrected NION Ultrastem 200 TEM/STEM microscope equipped with C-FEG emission gun and a fully loaded Enfinium™ ER system.
Voltage: 200 kV; data taken in STEM mode; EELS core-loss spectrum (400 – 2400 eV): 40 ms; dataset size: 128 x 128 pixels