Explains the principle behind electron counting and how it enables the K3 camera to deliver the highest-resolution results for single particle cryo-electron microscopy.
XS sample mounting
Procedure that outlines best practices for adhering electron microscopy samples onto the Ilion II or PECS II mounting jig prior to initiating the argon ion milling process.
Cleaning the guns and cold cathode gauge
Tutorial on how to clean the guns and cold cathode gauge on your PECS, PIPS or Ilion system.
STEM alignment for EELS analysis
Electron energy loss spectroscopy (EELS) tutorial for STEM alignment.
STEM imaging setup with the DigiScan system
Electron energy loss spectroscopy (EELS) tutorial on STEM imaging.
Lamella recipe for the PIPS II system
Setting up the lamella cleaning recipe for the PIPS II system.
Stage and beam alignment on the PIPS II system
Stage and beam alignment process prior to ion polishing samples on the PIPS II system.
Lamella alignment on the PIPS II system
Lamella alignment using the X, Y stage prior to ion polishing on the PIPS II system.
Optimizing STEM spectrum image acquisition for high speed analysis
STEM EELS spectrum imaging can reveal composition and chemical changes at the nanoscale and even the atomic scale in many cases. To reveal this information, the researcher needs to optimize not only the spectrometer, but also the sample and the STEM configuration. In this webinar, we discuss how to optimize the configuration of the STEM and EELS system for high speed spectrum imaging analysis. Attendees will learn the requirements of EELS camera and spectrometer settings needed to push the limits of spectrum image performance.