Explains the principle behind electron counting and how it enables the K3 camera to deliver the highest-resolution results for single particle cryo-electron microscopy.
XS sample mounting
Procedure that outlines best practices for adhering electron microscopy samples onto the Ilion II or PECS II mounting jig prior to initiating the argon ion milling process.
Cleaning the guns and cold cathode gauge
Tutorial on how to clean the guns and cold cathode gauge on your PECS, PIPS or Ilion system.
Lamella recipe for the PIPS II system
Setting up the lamella cleaning recipe for the PIPS II system.
Stage and beam alignment on the PIPS II system
Stage and beam alignment process prior to ion polishing samples on the PIPS II system.
Lamella alignment on the PIPS II system
Lamella alignment using the X, Y stage prior to ion polishing on the PIPS II system.