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New 4D STEM orientation mapping features, custom scan patterns for spectrum imaging, plus live EELS and 4D STEM imaging results with DigitalMicrograph 3.62

DigitalMicrograph^® version 3.62 is out now and brings support for big new features for 4D STEM, EELS, and spectrum imaging techniques.
STEMx OIM – 4D STEM orientation mapping made eaSI

• Calculate orientation and phase maps from 4D STEM data directly in DigitalMicrograph with a user-friendly workflow - No scripting required

Custom scanning for DigiScan 3 – Increasing flexibility to decrease damage

• Unlock multiple new scan patterns for use in  EELS, 4D STEM, or any other spectrum imaging experiment, and even make your own custom scan pattern via scripting
• Help decrease sample damage during acquisition of dose fractionated data or in-situ spectrum imaging experiments with new sparse acquisition controls in addition to non-raster scan patterns

Survey mapping – Real time results, real data reduction

• Get real time results with live EELS thickness mapping, live virtual aperture imaging, live differential phase contrast imaging, or customized image processing via scripting
• Conduct in-situ experiments with real-time EELS and 4D STEM analysis yielding smaller data volumes than full spectrum imaging

Elevate your offline DigitalMicrograph software to version 3.62 by visiting our Software Installation Page. For those with online systems, reach out to our dedicated service team to embark on your upgrade journey.