August 04, 2014
Gatan, Inc., a global leader focused on enhancing and extending the operation and productivity of electron microscopes, announced the launch of the OneView® camera for transmission electron microscopy.
Using a proprietary 16 megapixel CMOS sensor optimized for both sensitivity and speed,...
July 07, 2014
Guidelines
Welcome to Gatan Research Spotlight! Research Spotlight provides electron microscopists like you the opportunity highlight your laboratory’s work, recognize team members, encourage collaboration, plus share memorable images created on your electron microscope. Below is the submission...
June 24, 2014
Access webinar recording here.
The complementary nature of electron energy loss spectroscopy (EELS) and energy dispersive spectroscopy (EDS) signals makes it highly desirable to acquire both during transmission electron microscope (TEM) investigations of materials. With ongoing improvements in...
June 19, 2014
Argon ion polishing of focused ion beam specimens in PIPS II system
Anahita Pakzad, Gatan, Inc.
As researchers push boundaries of elemental analysis and HR imaging with their transmission electron microscope (TEM), ultra-low damage specimens less than 40 nm thickness are frequently required. When...
March 19, 2014
With the advance of EBSD systems and heating stages inside the SEM, phenomena such as phase transformations and recrystallization may now be observed in real-time with high spatial resolution. These processes can then be linked to the underlying microstructure, yielding a detailed insight into how...
January 28, 2014
In a recent study, Gatan Analytical TEM investigators demonstrated the ability to acquire atomic resolution EELS elemental maps with exceptional information densities. These atomic-level EELS elemental maps were acquired using the 200 kV analytical TEM system installed at IBM Almaden in San...
December 05, 2013
Transient Receptor Potential (TRP) ion channels are membrane proteins that play a role in the sensing of environmental and cellular signals. In a recent article in Nature, (Liao et. al.)**, researchers report that they have solved the 3D structure of the TRPV1 ion channel to a near-atomic...
October 24, 2013
Abingdon, UK, 21st October 2013:
Today, a joint initiative between JEOL and Gatan is announced which brings the power of Serial Block Face SEM (SBFSEM) to the JEOL family of scanning electron microscopes. JEOL is a world leader in the field of electron microscopy and, with the integration of Gatan...