Eliminate background, enhance detail: Metro counting camera for SAED and 4D STEM

See how Metro counting cameras enable low‑dose electron diffraction and 4D STEM without a beam stop. This webinar shows how electron counting suppresses background noise, expanding dynamic range, and producing high-fidelity patterns, even on highly beam‑sensitive materials. Patterns captured from graphene, zeolite, MOF, and COF samples will be presented. We’ll also show how DigitalMicrograph streamlines acquisition, processing, and visualization, making advanced in-situ diffraction and 4D STEM techniques easy.

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