Workshop on advances in imaging and analytics in TEM/STEM and 4D STEM
Join Gatan, JEOL, and AGH University of Science and Technology for our upcoming workshop on transmission electron microscopy (TEM) high-resolution imaging, electron counting imaging methods, and diffraction. During this event, you will spend time exploring the new possibilities for advancing your practical skills necessary to move your routine and advanced TEM studies forward.
Presentations from expert and users will be complemented by live-demos with application specialists from Gatan and JEOL, showcasing these techniques on JEOL’s 200 kV corrected NeoARM TEM, located at AGH University of Science and Technology, featuring high-resolution imaging, direct detection, segmented STEM detection, 4D STEM, and many more capabilities.
Program
During this two-day event, you will participate in live TEM demonstrations and sessions with experts. Participants are encouraged to send samples which may be considered for analysis before and during the workshop. Details about the full program, sample analysis, and invited speakers will be available online by May 10 at the registration link below.
Registration
Registration and catering for this in-person event are free, but seats are limited. Register by May 9 to secure your seat.