OnPoint BSE Detector

A backscattered electron detector for high speed low kV imaging in the SEM.

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The OnPoint™ detector is the standard for backscattered electron (BSE) detection that delivers unprecedented sensitivity and speed to better understand lightweight metals, polymers, plastics, and biological materials. Using a detector optimized for low kV, this system expands your ability to study low atomic number (Z) elements, uncoated biological samples, and large 3D datasets.

  • Resolves features distorted by charging or beam damage: Attains images at low kV to reduce charge build-up and to prevent damage to delicate samples
  • Captures large, 3D datasets quickly: Acquires large field of view images or 3D datasets up to six times faster
  • Differentiates low-Z elements: Delivers the highest signal-to-noise ratio (SNR) available to help differentiate between elements with a similar atomic number
  • Provides highest BSE collection efficiency: Produces higher SNR images because it captures electrons other detectors miss as well as minimizes the noise in the detection system
  • Achieves most accurate quantification: Forms images with the widest dynamic range enabling the most accurate determination of elemental composition in alloys and compounds



NPJ Regenerative Medicine

Koning, M.; Dumas, S. J.; Avramut, M. C.; Koning, R. I.; Meta, E.; Lievers, E. ; Wiersma, L. E.; Borri, M.; Liang, X.; Xie, L.; Liu, P.; Chen, F.; Lin, L.; Luo, Y.; Mulder, J.; Spijker, H. S.; Jaffredo, T.; van den Berg, B. M.; Carmeliet, P.; van den Berg. C. W.; Rabelink, T. J.


Tanaka, T.; Ohno, N.; Osanai, Y.; Saitoh, S.; Thai, T. Q.; Nishimura, K.; Shinjo, T.; Takemura, S.; Tatsumi, K.; Wanaka, A.

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