PECS II System

Broad argon ion beam system designed to polish and coat samples for SEM imaging and analytical techniques.

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Advantages: 

Fully automated argon ion polishing system suitable for preparation of SEM samples to prepare damage free surfaces, cross sections and deposit coatings to protect or eliminate charging.

  • Polish, etch or coat samples with a single pump down
  • Etch at voltages as low as 100 V for rapid and damage free preparation of sample surfaces 
  • Permit samples as large as 32 mm in diameter
  • Transfer samples from the PECS™ II instrument to a SEM/FIB or glovebox without exposure to air (optional)
  • Store and analyze image in DigitalMicrograph® software from Gatan for digital optical imaging
  • Display and control all PECS II parameters using integrated 10-inch color touch screen

Publications

Ultramicroscopy
2020

Gholinia, A.; Curd, M. E.; Bousser, E.; Taylor, K.; Hosman, T.; Coyle, S.; Hassel Shearer, M.; Hunt, J.; Withers, P. J.

Journal of Materials Science
2016

Mas, F.; Tassin, C.; Valle, N.; Robaut, F.; Charlot, F.; Yescas, M.; Roch, F.; Todeschini, P.; Bréchet, Y.

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