Advantages:
Introducing Stela® – the only fully integrated hybrid-pixel electron detector with the DigitalMicrograph® software for advanced electron diffraction studies. It utilizes the DECTRIS hybrid-pixel electron technology that employs electron counting to minimize noise and uses on-the-fly digitization for the highest dynamic range.
One platform, many solutions
- Industry-leading DigitalMicrograph software: Seamlessly integrates diffraction imaging and 4D STEM with hybrid-pixel electron detection
- Quickly turns subtle observations into bright insights: Analyze and assess results in minutes to optimize the experiment and collect the best 4D STEM dataset possible
Diffraction uncompromised
- Exceptional-dynamic range for 4D STEM: Captures weak and intense reflections to enable advanced diffraction studies
- Acquires a 4D cube at >16,000 pixels/s:
- Reduces specimen drift and damage
- Covers large sample areas in less time
- Optimized for imaging at low kV: Ideal for materials that require diffraction studies at <80 kV
Scientific Reports
2024
The performance of detectors for diffraction-based studies in (S)TEM
Microscopy and Microanalysis
2022
