EDAX EDS Powered by Gatan

The most intuitive and easy-to-use analytical tool for (scanning) transmission electron microscope (STEM) applications. 

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Advantages: 

The EDAX EDS Powered by Gatan offers fully integrated data acquisition and signal processing, coupled with features to guide setup and analysis. The Elite T silicon drift detector maximizes collection efficiency and optimizes light element performance, while DigitalMicrograph® (DM) software is the industry standard for TEM/STEM experimental control and analysis across the range of imaging and analytical techniques. This powerful combination helps users achieve the best possible results in challenging conditions.

Elite T silicon drift detector

  • Compact sensor geometry gets you closer to the sample, maximizing the solid angle and increasing count rates for faster data collection on sensitive samples
  • Delivers outstanding resolution and minimal peak shift at all count rates for optimal deconvolution and high maximum count rate for fast mapping and time to data
  • Uses windowless design to provide excellent sensitivity for low energies down to Al L

DigitalMicrograph software

  • Full DM integration provides a powerful, multi-dimensional, one-stop data analysis and visualization platform for all TEM/STEM applications
  • Allows you to customize your analysis with native support for DM scripting and Python programming
  • Utilizes highly configurable data acquisition and a single palette to precisely control and simplify all acquisition workflow: areas, lines, points, and time series
  • Multimodal capability consolidates all STEM data on a single platform, including energy dispersive spectroscopy (EDS), electron energy loss spectroscopy (EELS), 4D STEM, cathodoluminescence (CL), and imaging

 

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