With many people working from home due to COVID-19, Gatan is offering a limited-time version of GMS 3.4.1 that allows for the offline-installation of EELS Analysis, EDS Analysis, and EFTEM Analysis, until June 1, 2020, at no additional cost.
The Continuum™ series represents the next generation of electron energy loss spectroscopy (EELS) and energy-filtered transmission electron microscopy (EFTEM) systems from Gatan. By focusing on simplifying the operation of energy-loss systems without sacrificing any of the power or flexibility, the Continuum series enables new levels of productivity and data throughput. Built around new and exclusive detector systems, the Continuum delivers outstanding detector speed and quality for both EELS and EFTEM applications.
>10x higher productivity
- >8000 spectra per second at >95% duty cycle
- >10x faster system tuning
- Streamlined, workflow-based user interface
Revolutionary data quality
- Low-noise, high dynamic range CMOS detector
- Improved MTF and DQE from new XCR™ sensor stack technology
- Full gain correction in all acquisition modes
- Exclusive dynamic focus control
- Choose the K3™ electron counting direct detector for the ultimate EELS and EFTEM data quality
- Energy-filtered 4D STEM*
- In-situ EELS and EFTEM*
- Momentum-resolved EELS*
*Requires optional components
- GMS 3.4 Analysis Tools: Linear Least Squares Fitting
- EELS Quantification: Using Concurrent Standards
- EELS Quantification: Using Internal Standards
- GMS 3.4 Analysis Tools: Model-based EELS quantification & ELNES phase mapping
- Observing sample dynamics using in-situ EELS and heating webinar
- Nanocathodoluminescence reveals the optical properties of III-nitride light emitting diodes
- Chemical and compositional analysis of 3D NAND and FinFET devices
- Colorized EELS elemental map
Model 1065, 1066, 1069, 1069HR, 1077
High-speed composition and chemical analysis of Si/STO/PZT with GIF Continuum
In-situ EELS spectrum imaging at elevated temperature
Observing the effects of oxygen activity on NCA battery electrodes via in-situ EELS
Atomic-level EELS mapping using high energy edges in DualEELS™ mode
High speed EELS composition analysis, in DualEELS mode, of metal alloy ohmic contacts for the fabrication of III-V MOSFET devices
EELS: A tool for investigating biological materials
Fast simultaneous acquisition of low- and core-loss regions in the EELS spectrum from catalyst particles containing the heavy metals Au and Pd using the GIF Quantum® system
Fast STEM spectrum imaging using simultaneous EELS and EDS in Gatan Microscopy Suite® software
Review of recent advances in spectrum imaging and its extension to reciprocal space
The use of MLLS fitting approach to resolve overlapping edges in the EELS spectrum at the atomic level
Fast STEM EELS spectrum imaging analysis of Pd-Au based catalysts
The high efficiency of the latest generation EELS spectrometers allow highly detailed EELS spectra from heavy elements to be acquired in a matter of milliseconds resulting in composition maps with outstanding information content.
A quantitative investigation of biological materials using EELS
EELS has proved to be a valuable tool to obtain compositional information from biological samples. In addition to the composition, EELS also gives insight into the chemistry unveiling the nature of the chemical bonds and different oxidation states.
High-speed composition analysis of high-z metal alloys in DualEELS mode
Demonstrating that high-speed atomic EELS composition maps with high contrast and high signal-to-noise ratio can be acquired routinely from high-energy edges.
Fast atomic level EELS mapping analysis using high-energy edges in DualEELS mode
Demonstrating that atomic EELS mapping using high-energy edges is very effective. The high signal-to-background ratio of high-energy edges leads to simplified data extraction.
Atomic resolved EELS analysis across interfaces in III-V MOSFET high-k dielectric gate stacks
Demonstrating that EELS SI can reveal the elemental distribution at the gate of high-k MOSFET devices at atomic column level.