GIF Continuum and Continuum S

The next generation of advanced systems for EELS & EFTEM.

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The Continuum® series represents the next generation of electron energy loss spectroscopy (EELS) and energy-filtered transmission electron microscopy (EFTEM) systems from Gatan. By focusing on simplifying the operation of energy-loss systems without sacrificing any of the power or flexibility, the Continuum series enables new levels of productivity and data throughput. Built around new and exclusive detector systems, the Continuum delivers outstanding detector speed and quality for both EELS and EFTEM applications.

>10x higher productivity

  • >8000 spectra per second at >95% duty cycle
  • >10x faster system tuning
  • Streamlined, workflow-based user interface

Revolutionary data quality

Emerging applications

  • Energy-filtered 4D STEM*
  • In-situ EELS and EFTEM*
  • Momentum-resolved EELS*

*Requires optional components



Model 1065, 1066, 1069, 1069HR, 1077


GIF Continuum and Continuum S Systems


Using EELS to reveal ferric iron content from a Chang’e-5 lunar surface sample

Using EELS to reveal ferric iron content from a Chang’e-5 lunar surface sample

High-Speed Composition and Chemical Analysis of Nanoelectronic Materials with GIF Continuum

High-speed composition and chemical analysis of nanoelectronic materials with GIF Continuum


High-speed composition and chemical analysis of Si/STO/PZT with GIF Continuum

In-situ EELS spectrum imaging at elevated temperature

Observing the effects of oxygen activity on NCA battery electrodes via in-situ EELS

Atomic-level EELS mapping using high energy edges in DualEELS™ mode

High speed EELS composition analysis, in DualEELS mode, of metal alloy ohmic contacts for the fabrication of III-V MOSFET devices

EELS: A tool for investigating biological materials

Fast simultaneous acquisition of low- and core-loss regions in the EELS spectrum from catalyst particles containing the heavy metals Au and Pd using the GIF Quantum® system

Fast STEM spectrum imaging using simultaneous EELS and EDS in Gatan Microscopy Suite® software

Review of recent advances in spectrum imaging and its extension to reciprocal space

The use of MLLS fitting approach to resolve overlapping edges in the EELS spectrum at the atomic level



Fast STEM EELS spectrum imaging analysis of Pd-Au based catalysts
A quantitative investigation of biological materials using EELS
High-speed composition analysis of high-z metal alloys in DualEELS mode
Fast atomic level EELS mapping analysis using high-energy edges in DualEELS mode
Atomic resolved EELS analysis across interfaces in III-V MOSFET high-k dielectric gate stacks

Related products

BioContinuum® Imaging Filter
STEMx® System
Advanced STEM Detectors    
STEMPack™ with Advanced BF/DF Detector
STEMPack High-Speed EDS Acquisition Upgrade

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