Advantages:
TEM analytical holders are designed for basic imaging and analytical applications, such as electron diffraction and energy dispersive x-ray spectroscopy (EDS) analysis of crystalline TEM specimens.
- A beryllium specimen cradle minimizes unwanted x-ray signals
- Cut-outs in the specimen tip are matched to the TEM configuration and provide a clear path between the sample and detector to reduce shadowing for EDS analysis
- To facilitate quantitative x-ray analysis, non-rotating holder versions are equipped with a small Faraday cup located near the specimen cradle at the tip of the holder
- Electrical connections are available for the non-rotating versions of the holder
| Model number | Beryllium cradle | Specimen positioning | Specimen securing | Motorized control | Faraday cup | Max. electrical feed-throughs (optional) |
|---|---|---|---|---|---|---|
| 643 | Standard | α tilt | Hexring® mechanism | Standard | 6 | |
| 646 | Standard | α, β Tilt | Hexring | β Tilt | Standard | 4 – 61 |
| 650 | Standard | α Tilt and rotation | Hexring | Rotation | No | 0 |
| 925 | Standard | α, β Tilt and rotation1 | Hexring | No | 0 |
Influence of a single grain boundary on domain wall motion in ferroelectrics
Advanced Functional Materials
2014
Applied Catalysis A: General
2014
Chemistry of Materials
2014
Models 643, 646, 650, 925
Datasheets
Single Tilt Analytical Holder, model 643
Double Tilt Analytical Holder, model 646
Single Tilt Rotation Analytical Holder, model 650
Double Tilt Rotation Analytical Holder, model 925
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