See how Metro counting cameras enable low‑dose electron diffraction and 4D STEM without a beam stop. This webinar shows how electron counting suppresses background noise, expanding dynamic range, and producing high-fidelity patterns, even on highly beam‑sensitive materials. Patterns captured from graphene, zeolite, MOF, and COF samples will be presented. We’ll also show how DigitalMicrograph® streamlines acquisition, processing, and visualization, making advanced in-situ diffraction and 4D STEM techniques easy.